Active gate bias driver

ABSTRACT

A device is described that includes a gate driver configured to output, to a gate of a switch, a turn-on voltage for activating the switch in response to receiving an indication to activate the switch and an active gate bias driver configured to actively drive a voltage at the gate of the switch to a bias voltage in response to receiving an indication to deactivate the switch. The bias voltage is less than the turn-on voltage and wherein the bias voltage is greater than a ground voltage of the gate driver.

TECHNICAL FIELD

This disclosure relates to gate drivers for driving semiconductordevices.

BACKGROUND

In a switch, such as a field effect transistor (FET), a body diodeprovides a freewheeling capability and permits reverse recoverybehavior. For example, during the turn-off interval of the switch, thebody diode becomes forward biased and a reverse recovery chargeaccumulates in the switch. At the start of a turn-on interval of theswitch, the reverse recovery charge accumulated in the switchrecombines. During a switching cycle, this recombination results in aswitching power loss of the switch.

SUMMARY

In general, circuits and techniques are described for actively driving avoltage at a gate of a switch such that a reverse recovery charge in aswitch is reduced, thereby reducing the switching loss in that and inthe complementary switch. Rather than providing a ground voltage to agate of a switch to deactivate a switch, a gate driver may activelydrive a voltage of the gate of the switch to a bias voltage. Forexample, the gate driver may actively drive a voltage of the gate of theswitch to a bias voltage that is less than a threshold voltage duringthe dead time to reduce the body diode conduction of the switch.Additionally, the gate driver may actively adjust the bias voltage bytracking the temperature coefficient of the threshold voltage to avoidtemperature related dynamic effects like shoot through and undesiredturn-on. In this way, a reverse recovery charge in that and incomplimentary switch is reduced, thereby reducing a switching loss inthe switch.

In one example, the disclosure is directed to a device that includes agate driver configured to output, to a gate of a switch, a turn-onvoltage for activating the switch in response to receiving an indicationto activate the switch and an active gate bias driver configured toactively drive a voltage at the gate of the switch to a bias voltage inresponse to receiving an indication to deactivate the switch. The biasvoltage is less than the turn-on voltage and wherein the bias voltage isgreater than a ground voltage of the gate driver.

In another example, the disclosure is directed to a method includingoutputting, to a gate of a switch, a turn-on voltage for activating theswitch in response to receiving an indication to activate the switch andactively driving a voltage at the gate of the switch to a bias voltagein response to receiving an indication to deactivate the switch. Thebias voltage is less than the turn-on voltage and wherein the biasvoltage is greater than a ground voltage of the switch.

In another example, the disclosure is directed to a system including agate driver and an active gate bias driver. The gate driver isconfigured to generate a first control signal in response to receivingan indication to activate a switch, the first control signal beingconfigured to activate a first switching element such that the gatedrive module outputs, to a gate of the switch, a turn-on voltage foractivating the switch. The gate driver is further configured to generatea second control signal in response to receiving an indication todeactivate the switch, the second control signal being configured todeactivate a second switching element such that the gate drive moduleoutputs, to the gate of the switch, a ground voltage for deactivatingthe switch. The active gate bias driver comprises a timing controlmodule and an active gate bias module. The timing control module isconfigured to output an indication to provide an active gate biasvoltage for deactivating the switch based on the first and secondcontrol signals. The active gate bias module is configured to activelydrive a voltage at the gate of the switch to a bias voltage in responseto receiving the indication to provide the active gate bias voltage fordeactivating the switch. The bias voltage is less than the turn-onvoltage and wherein the bias voltage is greater than the ground voltagefor deactivating the switch.

The details of one or more examples are set forth in the accompanyingdrawings and the description below. Other features, objects, andadvantages of the disclosure will be apparent from the description anddrawings, and from the claims.

BRIEF DESCRIPTION OF DRAWINGS

FIG. 1 is a block diagram illustrating an example system having activegate bias capability for reducing a reverse recovery charge in a switch,in accordance with one or more aspects of the present disclosure.

FIG. 2 is a flow diagram illustrating operations performed by an examplesystem having active gate bias capability for reducing a reverserecovery charge in a switch, in accordance with one or more aspects ofthe present disclosure.

FIG. 3 is a block diagram illustrating a first example circuit havingactive gate bias capability for reducing a reverse recovery charge in aswitch, in accordance with one or more aspects of the presentdisclosure.

FIG. 4 is a diagram illustrating signals output by the example circuitshown in FIG. 3.

FIG. 5 is a flow diagram illustrating operations performed by theexample circuit shown in FIG. 3.

FIG. 6 is a block diagram illustrating a second example circuit havingactive gate bias capability for reducing a reverse recovery charge in aswitch, in accordance with one or more aspects of the presentdisclosure.

FIG. 7 is a flow diagram illustrating operations performed by theexample circuit shown in FIG. 6.

FIG. 8 is a block diagram illustrating a third example circuit havingactive gate bias capability for reducing a reverse recovery charge in aswitch, in accordance with one or more aspects of the presentdisclosure.

FIG. 9 is a flow diagram illustrating operations performed by theexample circuit shown in FIG. 8.

FIG. 10 is a block diagram illustrating a fourth example circuit havingactive gate bias capability for reducing a reverse recovery charge in aswitch, in accordance with one or more aspects of the presentdisclosure.

FIG. 11 is a block diagram illustrating a fifth example circuit havingactive gate bias capability for reducing a reverse recovery charge in aswitch, in accordance with one or more aspects of the presentdisclosure.

FIG. 12 is a block diagram illustrating a sixth example circuit havingactive gate bias capability for reducing a reverse recovery charge in aswitch, in accordance with one or more aspects of the presentdisclosure.

FIG. 13 is a block diagram illustrating a seventh example circuit havingactive gate bias capability for reducing a reverse recovery charge in aswitch, in accordance with one or more aspects of the presentdisclosure.

FIG. 14 is a diagram illustrating a performance of an example systemhaving active gate bias capability for reducing a reverse recoverycharge in a switch, in accordance with one or more aspects of thepresent disclosure.

FIG. 15 is a diagram illustrating a switching energy loss, in accordancewith one or more aspects of the present disclosure.

FIG. 16 is an exemplary circuit for a motor application, in accordancewith one or more aspects of the present disclosure.

FIG. 17 is a diagram illustrating a first thermal performance of theexemplary circuit of FIG. 16, in accordance with one or more aspects ofthe present disclosure.

FIG. 18 is a diagram illustrating a second thermal performance of theexemplary circuit of FIG. 16, in accordance with one or more aspects ofthe present disclosure.

DETAILED DESCRIPTION

In some applications, such as motor drive applications, direct current(DC) to DC power converters, solar inverters, etc., the switches mayoperate with switching losses making up a significant portion of thetotal losses Such switches may be configured in an inverter, such as anintelligent power module (IPM). For example, a gate driver mayalternatively activate a high side switch and a low side switch suchthat the high side switch is activated and the low side switch isdeactivated during a first portion of a switching cycle and the highside switch is deactivated and the low side switch is activated during asecond portion of the switching cycle.

A gate driver may use “dead time” to prevent the high and low sideswitch from being activated simultaneously. For example, the gate driverdeactivates the high and low side switches during a first deadtime of aswitching cycle. In the example, the gate driver activates the high sideswitch and deactivates the low side switch during a first portion of theswitching cycle. In the example, the gate driver deactivates the highand low side switches during a second deadtime of the switching cycle.In the example, the gate driver deactivates the high side switch andactivates the low side switch during a second portion of the switchingcycle. However, recovery losses due to the accumulation of minoritycarriers during the dead time portion of switching transitions in suchapplications may be a substantial portion of the switching losses. Forexample, in an inverter using dead time and operating at a bus voltageof 320 V, with a motor phase current of 200 milli-amps root mean square(mA_(rms)), and a pulse width modulation (PWM) frequency of 20 kHz, thereverse recovery losses may account for 63% of a total power loss of theinverter.

A technical area of the problem may be related to high voltage switchesused in IPMs for very low power motor drive applications (e.g., <200 W)for air conditioning and pump applications. As used herein a highvoltage switch may refer to switches configured to operate between 250volts and 1200 volts. In these applications, the motors may spend a vastmajority of their operating life running under light load conditions ata fraction of the maximum load they were designed for. In theseapplications, IPMs may be operating in the 6-20 kHz frequency range. Inthese applications, turn-on switching losses of the switches maydominate over the conduction losses. A main contributor to the switchinglosses may be due to the recovery losses of the internal body diode ofthe switch. This recovery loss may be due to the storage of minoritycarriers during a dead time portion of the switching transitions. Forexample an inverter utilizing this IPMs may operate at bus voltageV_(BUS)=320 V, motor phase current I_(motor)=200 m_(Arms), and PWMfrequency f_(sw)=20 kHz, it may be found that reverse recovery losses ofthe conventional switch makeup 63% of the total inverter losses.Therefore, it may be very important to reduce the body diode recoverylosses to improve the turn-on losses of the switch and improve overallsystem efficiency.

In an effort to reduce switching losses, electron irradiation andplatinum (Pt) implants has been used. Even with these interventions,losses from the reverse recovery can amount to 40% of the total lossesfor example in a fan drive inverter operating at 20 kHz. Additionallysome techniques may focus on controlling a reverse recovery body diodecharge using gate bias control that relies on a diode (e.g., diodechains, a diode and resistors, etc.). However such techniques may bias agate at a diode forward voltage drop of the diode (e.g., less than 0.7V), which is not sufficient for high voltage switches. For example, suchtechniques may not work with high voltage (e.g., 250-1200 V) FET devicesthat have a gate threshold of several volts because the gate-bias effectis more pronounced at gate voltages much higher than a diode forwardvoltage drop of the diode (e.g., 0.7 V). In addition, adding an isolateddiode device into a modern high voltage integrated circuit fabricationprocess may require special isolation techniques and process steps whichmay increase a fabrication cost for a resulting device tremendously.Further, if a non-isolated diode is used, when the non-isolated diode isforwarded, a carry will disrupt logic operation, which may causelatch-ups in a driver integrated circuit. Furthermore, such techniquesmay suffer from an effect that a gate-bias level drops with timeinversely proportional to a gate capacitance and a diode impedance.Thus, such techniques may only be suitable for power converters thatoperate with very small dead times (e.g., 20 nanoseconds (ns)).Moreover, a temperature coefficient of a diode (e.g., −2.5 mV per degreeCelsius) may not track a temperature coefficient of switch (e.g., −8.5mV per degree Celsius) causing instabilities in high temperatureoperation. A gate may be constantly biased and therefore may result insub threshold leakage as temperature rises. Moreover, the abovementioned techniques typically operate at very high frequencies, forinstance, higher than 100 kHz and lower voltage classes (e.g., <100 V).These very high frequencies and lower voltage classes may be unsuitablefor inverters used in motor drives which may operate at higher voltages(e.g., 250-1200 V) and much longer dead times (e.g., 2 milliseconds(ms)) and frequencies typically below 100 kHz.

Rather than relying on electron irradiation or a diode forward voltagedrop, circuits and techniques are described for actively driving avoltage at a gate of a switch such that a reverse recovery charge in aswitch is reduced. For example, a system may actively drive the voltageat the gate of the switch to account for variations in temperature ofthe switch, or other variations in switch and dynamically adjust itsdriving capability accordingly. In this way, the system may reducelosses that would otherwise occur in the switch.

FIG. 1 is a block diagram illustrating an example system 100 havingactive gate bias capability for reducing a reverse recovery charge inswitch 106, in accordance with one or more aspects of the presentdisclosure. FIG. 1 shows system 100 which includes controller 101, gatedriver 102, active gate bias driver 104, and switch 106. The gate driveoutput of active gate bias driver 104 is electrically coupled to thegate 110 of switch 106. System 100 may include additional componentsthan those shown. In some examples, system 100 may be implemented as asingle or multiple integrated circuit (IC) packages.

Controller 101 provides instructions to activate and deactivate switch106. In some examples, controller 101 may be a modulation (e.g.,pulse-width modulation) controller. For example, controller 101 mayoutput, to gate driver 102 a high signal (e.g., logical ‘1’) to indicatean instruction to activate switch 106 during a first portion of apulse-width modulation cycle. In the example, controller 101 may output,to gate driver 102 a low signal (e.g., logical ‘0’) to indicate aninstruction to deactivate switch 106 during a second portion of thepulse-width modulation cycle. In some examples, however, controller 101may output, to gate driver 102 a low signal (e.g., logical ‘0’) toindicate an instruction to activate switch 106 and output, to gatedriver 102 a high signal (e.g., logical ‘1’) to indicate an instructionto deactivate switch 106.

In some examples, controller 101 may output an instruction to activateswitch 106 using a pulse-width modulation cycle that includes a deadtime. For instance, controller 101 may output, to gate driver 102, aninstruction to deactivate switch 106 and a corresponding high sideswitch during a first portion of a switching cycle. During a secondportion of the switching cycle, controller 101 may output, to gatedriver 102, an instruction to activate the high side switch and output,to gate driver 102, an instruction to deactivate switch 106. During athird portion of the switching cycle, controller 101 may output, to gatedriver 102, an instruction to deactivate the high side switch and switch106. During a fourth portion of the switching cycle, controller 101 mayoutput, to gate driver 102, an instruction to deactivate the high sideswitch and output, to gate driver 102, an instruction to activate switch106. In this way, controller 101 may decrease a likelihood that the highside switch and switch 106 are inadvertently activated together.

Controller 101 may comprise any suitable arrangement of hardware,software, firmware, or any combination thereof, to perform thetechniques attributed to controller 101 that are described herein.controller 101 may include any one or more microprocessors, digitalsignal processors (DSPs), application specific integrated circuits(ASICs), field programmable gate arrays (FPGAs), or any other equivalentintegrated or discrete logic circuitry, as well as any combinations ofsuch components. When controller 101 includes software or firmware,controller 101 may further include any necessary hardware for storingand executing the software or firmware, such as one or more memories andone or more processors or processing units. In general, a processingunit may include one or more microprocessors, DSPs, ASICs, FPGAs, or anyother equivalent integrated or discrete logic circuitry, as well as anycombinations of such components.

Switch 106 represents any conceivable semiconductor device that isconfigured to receive a gate driver signal from a driver, such as gatedriver 102 and/or active gate bias driver 104. For example, switch 106may be a Field-Effect-Transistor (FET). For instance, switch 106 may bea metal-oxide-semiconductor FET (MOSFET) used in a Switching Mode PowerSupply (SMPS). Examples of a switch may include, but are not limited to,junction field-effect transistor (JFET), metal-oxide-semiconductor FET(MOSFET), dual-gate MOSFET, insulated-gate bipolar transistor (IGBT),any other type of FET, or any combination of the same. Examples ofMOSFETS may include, but are not limited to, p-channel MOSFET (pMOS),n-channel MOSFET (nMOS), double diffused MOSFET (DMOS), or any othertype of MOSFET, or any combination of the same. In some examples, switch106 may comprise a high-electron mobility transistor. Also, in somecases, switch 106 may comprise a gallium nitride (GaN) based transistor.Other materials may also be used to realize switch 106. In someexamples, switch 106 may be a high voltage switch. As used herein a highvoltage switch may refer to a switch configured to operate between 250volts and 1200 volts.

Switch 106 includes three terminals however in other examples, switch106 may include additional terminals. The gate 110 of switch 106 may beelectrically coupled to active gate bias driver 104. Terminals 108A and108B of switch 106 may be coupled to a voltage source and/or a load. Inoperation, switch 106 may receive at gate 110, a gate driver signal fromactive gate bias driver 104 that causes switch 106 to change operatingstates. Depending on the magnitude of the voltage of the gate driversignal at gate 110, switch 106 may activate (e.g., “switch-on”) ordeactivate (e.g., “switch-off”). When activated, switch 106 may conducta current between terminals 108A and 108B of switch 106. Whendeactivate, switch 106 may cease conducting the current, and block avoltage between terminals 108A and 108B of switch 106.

Gate driver 102 provides driver capabilities to system 100 for drivingswitch 106. For example, gate driver 102 may output a turn-on voltagethat causes switch 106 to activate or output a turn-off voltage thatcauses switch 106 to deactivate. As used herein, a turn-on voltage mayrefer to a voltage that exceeds a threshold voltage to activate switch106 and a turn-off voltage may refer to a voltage that is less than thethreshold voltage to deactivate switch 106. For instance, the turn-offvoltage may be a ground of system 100. In some instances, the turn-offvoltage may be a voltage at terminal 108B (e.g., a source of switch106).

Gate driver 102 may be a stand-alone component of system 100 or may bepart of a larger system or component of system 100. For example, gatedriver 102 may be a discrete component or in other examples, gate driver102 may be part of controller 101. In some examples, gate driver 102 maybe a high voltage gate driver. As used herein a high voltage gate drivermay refer to a gate driver configured to operate between 250 volts and1200 volts.

Gate driver 102 may comprise any suitable arrangement of hardware,software, firmware, or any combination thereof, to perform thetechniques attributed to gate driver 102 that are described herein. Gatedriver 102 may include any one or more microprocessors, digital signalprocessors (DSPs), application specific integrated circuits (ASICs),field programmable gate arrays (FPGAs), or any other equivalentintegrated or discrete logic circuitry, as well as any combinations ofsuch components. When gate driver 102 includes software or firmware,gate driver 102 may further include any necessary hardware for storingand executing the software or firmware, such as one or more memories andone or more processors or processing units.

Active gate bias driver 104 may be a stand-alone component of system 100or may be part of a larger system or component of system 100. Forexample, active gate bias driver 104 may be a discrete component or inother examples, active gate bias driver 104 may be part of a controller(e.g., a modulation controller that controls gate driver 102, activegate bias driver 104, switch 106, and other components of system 100).In some examples, active gate bias driver 104 may be a high voltageactive gate bias driver. As used herein a high voltage active gate biasdriver may refer to an active gate bias driver configured to operatebetween 250 volts and 1200 volts.

Active gate bias driver 104 may comprise any suitable arrangement ofhardware, software, firmware, or any combination thereof, to perform thetechniques attributed to active gate bias driver 104 that are describedherein. Active gate bias driver 104 may include any one or moremicroprocessors, digital signal processors (DSPs), application specificintegrated circuits (ASICs), field programmable gate arrays (FPGAs), orany other equivalent integrated or discrete logic circuitry, as well asany combinations of such components. When active gate bias driver 104includes software or firmware, active gate bias driver 104 may furtherinclude any necessary hardware for storing and executing the software orfirmware, such as one or more memories and one or more processors orprocessing units.

Active gate bias driver 104 provides active gate bias drivercapabilities to system 100 for driving switch 106. For example, activegate bias driver 104 may actively drive a voltage at gate 110 of switch106 to a bias voltage without exceeding a threshold voltage to activateswitch 106. As used herein, a bias voltage may refer to a voltage thatis less than a threshold voltage to activate switch 106 and greater thana ground voltage of system 100.

Rather than provide a minimum or ground voltage to gate 110 of switch106 to deactivate switch 106, active gate bias driver 104 may activelydrive a voltage at gate 110 of switch 106 to a bias voltage. Forexample, active gate bias driver 104 may be configured to actively drivea voltage at gate 110 of switch 106 to a bias voltage according to areference voltage signal. Additionally, or alternatively, active gatebias driver 104 may be configured to actively drive a voltage at gate110 of switch 106 to a bias voltage according to a current at switch 106(e.g., flowing between terminal 108A and terminal 108B). In this way, areverse recovery charge in switch 106 is reduced, thereby reducinglosses that would otherwise occur in switch 106.

FIG. 2 is a flow diagram illustrating operations performed by an examplesystem having active gate bias capability for reducing a reverserecovery charge in a switch, in accordance with one or more aspects ofthe present disclosure. For example, gate driver 102 and active gatebias driver 104 of system 100 of FIG. 1 may perform operations 202-206of FIG. 2 to control switch 106 of system 100 of FIG. 1. FIG. 2 isdescribed below in the context of system 100 of FIG. 1 for illustrationpurposes only.

In operation, gate driver 102 may output a turn-on voltage foractivating switch 106 in response to receiving an indication to activateswitch 106 (202). For example, in response to receiving, from controller101, an indication (e.g., a high signal) to activate switch 106, gatedriver 102 outputs a turn-on voltage to activate switch 106.

In some examples, gate driver 102 may optionally output a turn-offvoltage for deactivating switch 106 in response to receiving anindication to deactivate switch 106 (204). For example, in response toreceiving, from controller 101, an indication (e.g., a low signal) todeactivate switch 106, gate driver 102 outputs a ground voltage todeactivate switch 106. In any case, active gate bias driver 104 mayactively drive a voltage at gate 110 of switch 106 to a bias voltage inresponse to receiving an indication to deactivate switch 106 (206). Forexample, in response to receiving, from controller 101, an indication(e.g., a low signal) to deactivate switch 106, active gate bias driver104 actively drives a voltage at gate 110 of switch 106 to a biasvoltage based on a temperature of switch 106, a current flowing fromterminal 108A between 108 B, a voltage at gate 110, or a combinationthereof.

FIG. 3 is a block diagram illustrating a first example circuit 300having active gate bias capability for reducing a reverse recoverycharge in a switch, in accordance with one or more aspects of thepresent disclosure. FIG. 3 shows gate driver 302, active gate biasdriver 304, and switch 306. Gate driver 302 may be an example of gatedriver 102 of FIG. 1. Active gate bias driver 304 may be an example ofactive gate bias driver 104 of FIG. 1. Switch 306 may be an example ofswitch 106 of FIG. 1. For instance, switch 306 may include gate 310,which may be an example of gate 110. FIG. 3 is described in the contextof FIGS. 1 and 2 for exemplary purposes only.

Gate driver 302 may include gate drive control 320 and switchingelements 322 and 324. Switching elements 322 and 324 may include, butare not limited to, a FET. As shown, switching element 322 may be ap-channel MOSFET, however, in other examples, switching element 322 maybe different. Similarly, switching element 324 may be an n-channelMOSFET, however, in other examples, switching element 324 may bedifferent. Gate drive control 320 may be configured to generate a firstcontrol signal in response to receiving an indication to activate switch306. For example, in response to receiving, from controller 101, a lowsignal at the high side input (e.g., HS_(in)), gate drive control 320may generate a first control signal (e.g., V_(CC)) that deactivatesswitching element 322 to electronically isolate gate 310 of switch 306from turn-on voltage 327. In response, however, to receiving, fromcontroller 101, a high signal at the high side input, gate drive control320 may generate a first control signal (e.g., ground) that activatesswitching element 322 to generate a channel electronically connectingturn-on voltage 327 to gate 310 of switch 306. Similarly, gate drivecontrol 320 may be configured to generate a second control signal inresponse to receiving an indication to deactivate switch 306. Forexample, in response to receiving, from controller 101, a low signal atthe low side input (e.g., LS_(in)), gate drive control 320 may generatea second control signal (e.g., ground) that deactivates switchingelement 324 to electronically isolate gate 310 of switch 306 from ground328. In response, however, to receiving, from controller 101, a highsignal at the low side input, gate drive control 320 may generate asecond control signal (e.g., V_(CC)) that activates switching element324 to generate a channel electronically connecting ground 328 to gate310 of switch 306. In this way, gate driver 302 may selectively connectgate 310 of switch 306 to either turn-on voltage 327 or ground 328.

Active gate bias driver 304 may include timing control module 330 andactive gate bias module 331. In some examples, timing control module 330may be an operational transconductance amplifier. Timing control module330 may be configured to output an indication to provide an active gatebias voltage for deactivating the switch based on the first and secondcontrol signals. For example, in response to receiving, from gate drivecontrol 320, a first control signal indicating to deactivate switchingelement 322 and a second control signal indicating to deactivateswitching element 324, timing control module 330 may cause active gatebias module 331 to provide an active gate bias to gate 310 of switch306. In the example, in response, however, to receiving, from gate drivecontrol 320, a first control signal indicating to activate switchingelement 322 timing control module 330 may cause active gate bias module331 to refrain from providing an active gate bias to gate 310 of switch306. Similarly, in the example, in response to receiving, from gatedrive control 320, a second control signal indicating to activateswitching element 324 timing control module 330 may cause active gatebias module 331 to refrain from providing an active gate bias to gate310 of switch 306. In this way, timing control module 330 may activateactive gate bias module 331 during a dead time switching of switch 306.

Active gate bias module 331 may actively drive a voltage at gate 310 ofswitch 306 at various portions of a switching cycle. For example, activegate bias module 331 may actively drive a voltage at gate 310 of switch306 to a bias voltage during a dead time of switch 306. For instance, inresponse to receiving, from gate drive control 320, a first controlsignal indicating to deactivate (e.g., low signal) switching element 322and a second control signal indicating to deactivate switching element324, timing control module 330 may determine that switch 306 isoperating in a dead time and, in response to determining that switch 306is operating in the dead time, may cause active gate bias module 331 toactively drive a voltage at gate 310 of switch 306 to the bias voltageduring the dead time of switch 306. Additionally, or alternatively,active gate bias module 331 may actively drive a voltage at gate 310 ofswitch 306 to a bias voltage during a body diode conduction of switch306. Additionally, or alternatively, active gate bias module 331 mayactively drive a voltage at gate 310 of switch 306 to a bias voltagewhen switch 306 is deactivated. For instance, in response to receiving,from gate drive control 320, a first control signal indicating todeactivate switching element 322 and a second control signal indicatingto activate switching element 324, timing control module 330 maydetermine that switch 306 is deactivated and, in response to determiningthat switch 306 is deactivated, may cause active gate bias module 331 toactively drive a voltage at gate 310 of switch 306 to the bias voltageduring the dead time of switch 306.

In some examples, active gate bias module 331 may actively drive avoltage at gate 310 of switch 306 to different bias voltage fordifferent portions of a switching cycle. For example, active gate biasmodule 331 may actively drive a voltage at gate 310 of switch 306 to afirst bias voltage during a dead time of switch 306 before switch 306 isactivated. In the example, active gate bias module 331 may activelydrive a voltage at gate 310 of switch 306 to a second bias voltageduring a dead time of switch 306 before switch 306 is deactivated.

Active gate bias module 331 may include differential amplifier 332,switching elements 334 and 336. Switching elements 334 and 336 mayinclude, but are not limited to, a FET. In the example of FIG. 3, activegate bias module 331 is configured to actively drive a voltage at gate310 of switch 306 to a bias voltage in response to receiving anindication to provide the active gate bias voltage for deactivatingswitch 306. For example, in response to receiving, from timing controlmodule 330, a signal to activate (e.g., high signal) switching elements334 and 336, switching elements 334 and 336 generate an electricalchannel between the output of differential amplifier 332 to gate 310 ofswitch 306, thereby electronically connecting differential amplifier 332to gate 310 of switch 306.

In the example of FIG. 3, active gate bias driver 304 is configured toreceive a reference voltage signal. For instance, differential amplifier332 receives the reference voltage signal at a negative input terminal.In the example, active gate bias driver 304 is configured to activelydrive the voltage at gate 310 of switch 306 to the bias voltageaccording to the reference voltage signal. Additionally, oralternatively, in some examples, active gate bias driver 304 isconfigured to receive an indication of a gate voltage at gate 310 ofswitch 306 and to actively drive the voltage at gate 310 of switch 306to the bias voltage according to the indication of the gate voltage. Forinstance, differential amplifier 332 actively drives the voltage at gate310 of switch 306 to the bias voltage to minimize a difference betweenthe voltage at gate 310 and the reference voltage signal.

A reference voltage signal may be output from reference voltage source326 having a temperature coefficient corresponding to a temperaturecoefficient of a gate threshold (V_(th)) for switch 306. For example, inresponse to switch 306 heating up, the gate threshold (V_(th)) forswitch 306 decreases. In the example, in response to reference voltagesource 326 heating up, the reference voltage signal for switch 306decreases. Similarly, in response to switch 306 cooling, the gatethreshold (V_(th)) for switch 306 increases. In the example, in responseto reference voltage source 326 cooling, the reference voltage signalfor switch 306 increase. Reference voltage source 326 and switch 306 maybe spatially proximate, such that a change in temperature in the switch306 is translated into a corresponding change in temperature inreference voltage source 326. Additionally, or alternatively, referencevoltage source 326 and switch 306 may be spatially proximate, such thata change in temperature in the reference voltage source 326 istranslated into a corresponding change in temperature in switch 306. Inthis way, active gate bias driver 304 may match a temperature responseof switch 306 to avoid temperature related dynamic effects like shootthrough and undesired turn-on in switch 306, thereby reducing recoverylosses of switch 306.

Reference voltage source 326 may select an optimum gate voltage shapeduring dead time switching and/or during body diode conduction of switch306 to reduce sub-threshold leakage when a gate bias is applied tofurther reduce power loss. For example, active gate bias module 331 mayactively drive a voltage at gate 310 of switch 306 to a first biasvoltage during a first dead time of switch 306 before switch 306 isactivated. In the example, active gate bias module 331 may activelydrive a voltage at gate 310 of switch 306 to a second bias voltageduring a second dead time of switch 306 before switch 306 isdeactivated. In this way, active gate bias driver 304 may reduce asub-threshold leakage during the deadtime while the gate bias isapplied, thereby reducing the recovery losses.

FIG. 4 is a diagram illustrating signals output by the example circuitshown in FIG. 3. FIG. 4 is described in the context of FIGS. 1-3 forexemplary purposes only. In the example of FIG. 4, gate drive control320 outputs, to a gate of switching element 322 (e.g., a PMOS) firstcontrol signal 402 and outputs, to a gate of switching element 324(e.g., a NMOS) second control signal 404. FIG. 4 illustrates a secondcontrol signal 404 that is inverted as inverted second control signal406. In the example of FIG. 4, timing control module 330 receives firstcontrol signal 402 and second control signal 404 and outputs, toswitching elements 334 and 336 of active gate bias module 331, a timingcontrol signal 408. As shown, timing control signal 408 may indicate adead time of switch 306. That is, timing control signal 408 may indicatea portion of a pulse width modulation signal where switching elements322 and 324 are deactivated. In any case, active gate bias module 331actively drives a voltage 410 at gate 310 of switch 306 according totiming control signal 408. As shown, active gate bias module 331actively drives a voltage 410 at gate 310 of switch 306 to bias voltage420 when the timing control signal 408 indicates the dead time of switch306 (e.g., when timing control signal 408 is high).

FIG. 5 is a flow diagram illustrating operations performed by theexample circuit shown in FIG. 3. FIG. 5 is described in the context ofFIGS. 1-4 for exemplary purposes only. In operation, gate driver 302 maydetermine whether to activate switch 306 (502). For example, gate driver302 may determine to activate switch 306 in response to receiving, fromcontroller 101, a high signal at the high input (e.g., HS_(in)) and alow signal at the low input (e.g., LS_(in)). In response to determiningto activate switch 306, gate driver 302 may output a turn-on voltage foractivating switch 306 (520). For example, in response to receiving, fromcontroller 101, an indication (e.g., a high signal) to activate switch306, gate driver 302 outputs a turn-on voltage to activate switch 306.

In response, however, to determining to deactivate switch 306, gatedriver 302 may output a turn-off voltage for deactivating switch 306(504). For example, in response to receiving, from controller 101, anindication (e.g., a low signal) to deactivate switch 306, gate driver302 outputs a turn-off voltage to activate switch 306. In the example,active gate bias driver 304 may actively drive a voltage at gate 310 ofswitch 306 to a bias voltage according to a reference voltage signal anda gate voltage at gate 310 of switch 306 (506). For example, when thetiming control signal 408 indicates the dead time of switch 306,differential amplifier 332 of active gate bias driver 304 activelydrives the voltage at gate 310 of switch 306 to the bias voltage tominimize a difference between the voltage at gate 310 and the referencevoltage signal.

FIG. 6 is a block diagram illustrating a second example circuit 600having active gate bias capability for reducing a reverse recoverycharge in a switch, in accordance with one or more aspects of thepresent disclosure. FIG. 6 shows gate driver 602, active gate biasdriver 604, and switch 606. Gate driver 602 may be an example of gatedriver 102 of FIG. 1 and/or an example of gate driver 302 of FIG. 3. Forexample, gate drive control 620 may be an example of gate drive control320 of FIG. 3 and/or switching elements 622 and 624 may be examples ofswitching elements 322 and 324, respectively, of FIG. 3. Active gatebias driver 604 may be an example of active gate bias driver 104 of FIG.1 and/or an example of active gate bias driver 304 of FIG. 3. Forexample, timing control module 630 may be an example of timing controlmodule 330, active gate bias module 631 may be an example of active gatebias module 331. Switch 606 may be an example of switch 106 of FIG. 1.For instance, switch 606 may include gate 610, which may be an exampleof gate 610. FIG. 6 is described in the context of FIGS. 1-5 forexemplary purposes only.

In the example of FIG. 6, active gate bias driver 604 may be configuredto receive an indication of a current flowing through switch 606. Forinstance, active gate bias driver 604 may receive a voltage at resistiveelement 652 that indicates a current flowing through switch 606. In someexamples, signal conditioning module 638 may optionally condition thevoltage output by resistive element 652. In any case, active gate biasdriver 604 may be configured to actively drive the voltage at gate 610of switch 606 to the bias voltage according to the indication of thecurrent flowing through switch 606. For instance, a differentialamplifier of active gate bias module 631 may actively drive the voltageat gate 610 of switch 606 to the bias voltage to minimize a differencebetween the voltage at resistive element 652 and a reference voltagesignal (e.g., V_(CS)).

Accordingly, rather than relying on a voltage reference internally,active gate bias driver 604 may sense current during a recovery time andcontrolled through an integrated active clamp to minimize power lossduring recovery time. Active gate bias driver 604 may be configured forclosed loop active gate control to clamp a gate voltage at gate 610during Miller induced gate turn on.

FIG. 7 is a flow diagram illustrating operations performed by theexample circuit shown in FIG. 6. FIG. 7 is described in the context ofFIGS. 1-6 for exemplary purposes only. In operation, gate driver 602 maydetermine whether to activate switch 606 (702). For example, gate driver602 may determine to activate switch 606 in response to receiving, fromcontroller 101, a high signal at the high input (e.g., HS_(in)) and alow signal at the low input (e.g., LS_(in)). In response to determiningto activate switch 606, gate driver 602 may output a turn-on voltage foractivating switch 606 (720). For example, in response to receiving, fromcontroller 101, an indication (e.g., a high signal) to activate switch606, gate driver 602 outputs a turn-on voltage to activate switch 606.

In response, however, to determining to deactivate switch 606, gatedriver 602 may output a turn-off voltage for deactivating switch 606(704). For example, in response to receiving, from controller 101, anindication (e.g., a low signal) to deactivate switch 606, gate driver602 outputs a turn-off voltage to activate switch 606. In the example,active gate bias driver 604 may actively drive a voltage at gate 610 ofswitch 606 to a bias voltage according to a current flowing throughswitch 306 (706). For example, when the timing control signal 408indicates the dead time of switch 606, a differential amplifier ofactive gate bias driver 604 actively drives the voltage at gate 610 ofswitch 606 to the bias voltage to minimize a difference between thevoltage at resistive element 652 and a reference voltage signal.

FIG. 8 is a block diagram illustrating a third example circuit 800having active gate bias capability for reducing a reverse recoverycharge in a switch, in accordance with one or more aspects of thepresent disclosure. FIG. 8 shows gate driver 802, active gate biasdriver 804, and switch 806. Gate driver 802 may be an example of gatedriver 102 of FIG. 1. Gate driver 802 may be an example of gate driver303. For instance, gate drive control 620 may be an example of gatedrive control 320 of FIG. 3 and/or switching elements 822 and 824 may beexamples of switching elements 322 and 324, respectively, of FIG. 3.Gate driver 802 may be an example of gate driver 602. For instance,switching elements 822 and 824 may be examples of switching elements 622and 624, respectively, of FIG. 6. Active gate bias driver 804 may be anexample of active gate bias driver 104 of FIG. 1. Differential amplifier832 may be an example of differential amplifier 332 of FIG. 3 and/ordifferential amplifier 632 of FIG. 6. Timing control module 830 may bean example of timing control module 330, active gate bias module 831 maybe an example of active gate bias module 331. Switch 806 may be anexample of switch 106 of FIG. 1. For instance, switch 806 may includegate 810, which may be an example of gate 110 of FIG. 1. Resistiveelement 852 may be substantially similar to resistive element 652 ofFIG. 6. FIG. 8 is described in the context of FIGS. 1-7 for exemplarypurposes only.

In the example of FIG. 8, active gate bias driver 804 may include buffermodule 840 and switching elements 842 and 844. Switching elements 842and 844 may include, but are not limited to, a FET. Buffer module 840may be configured to store a buffered voltage to correspond to adetected voltage at gate 810. For instance, buffer module 840 mayinclude one or more capacitive elements. Timing control module 830 maybe configured to cause active gate bias driver 804 to initially output,to gate 810 of switch 806, a buffered voltage when actively driving thevoltage at gate 810 of switch 806 to the bias voltage. For instance,timing control module 830 may activate switching element 844 to generatean electrical channel between buffer module 840 and gate 810 of switch806 for an initial portion (less than 20%) of a dead time of a switchingcycle. In some examples, active gate bias driver 804 may be configuredto modify the buffered voltage to correspond to a detected voltage atgate 810 of switch 806. In the example, the detected voltage may bedetected after initially outputting the buffered voltage and prior toactivating switch 806. For instance, timing control module 830 mayactivate switching element 844 at a final portion (e.g., the last 20%)of the dead time of the switching cycle, to store a voltage detected atgate 810 of switch 806 in buffer module 840. In this way, to improve anactive generic disturbance (GD) close-loop response speed, a previousrecovery cycle gate voltage may be stored in a gate voltage sense andhold circuitry of buffer module 840. During a standard gate driveperiod, voltage at the gate voltage sense and hold circuitry of buffermodule 840 may be buffered on to the active GD output. In the nextrecovery cycle, the active GD may quickly establish the operating pointto improve the speed during recovery period.

FIG. 9 is a flow diagram illustrating operations performed by theexample circuit shown in FIG. 8. FIG. 9 is described in the context ofFIGS. 1-8 for exemplary purposes only. In operation, gate driver 802 maydetermine whether to activate switch 806 (902). For example, gate driver802 may determine to activate switch 806 in response to receiving, fromcontroller 101, a high signal at the high input (e.g., HS_(in)) and alow signal at the low input (e.g., LS_(in)). In response to determiningto activate switch 806, gate driver 802 may output a turn-on voltage foractivating switch 806 (920). For example, in response to receiving, fromcontroller 101, an indication (e.g., a high signal) to activate switch806, gate driver 802 outputs a turn-on voltage to activate switch 806.

In response, however, to determining to deactivate switch 806, gatedriver 802 may output a turn-off voltage for deactivating switch 806(904). For example, in response to receiving, from controller 101, anindication (e.g., a low signal) to deactivate switch 806, gate driver802 outputs a turn-off voltage to activate switch 806. In the example,active gate bias driver 804 may actively drive a voltage at gate 810 ofswitch 806 to a bias voltage (906). For example, when the timing controlsignal 408 indicates the dead time of switch 806, timing control module830 may activate switching element 844 to generate an electrical channelbetween buffer module 840 and gate 810 of switch 806 for an initialportion (less than 20%) of a dead time of a switching cycle. In theexample, active gate bias driver 804 may modify the buffered voltage tocorrespond to a detected voltage at the gate (906). For example, whenthe timing control signal 408 indicates a final portion of the dead timeof switch 806, timing control module 830 may activate switching element844 to generate an electrical channel between buffer module 840 and gate810 of switch 806 to store a voltage at gate 810 of switch 806 in buffermodule 840.

FIG. 10 is a block diagram illustrating a fourth example circuit 1000having active gate bias capability for reducing a reverse recoverycharge in a switch, in accordance with one or more aspects of thepresent disclosure. FIG. 10 shows gate driver 1002, active gate biasdriver 1004, and switch 1006. Gate driver 1002 may be an example of gatedriver 102 of FIG. 1. Gate driver 1002 may be an example of gate driver302 of FIG. 3. For instance, switching elements 1022 and 1024 may beexamples of switching elements 322 and 324, respectively, of FIG. 3.Active gate bias driver 1004 may be an example of active gate biasdriver 104 of FIG. 1. Switch 1006 may be an example of switch 106 ofFIG. 1. For instance, switch 1006 may include gate 1010, which may be anexample of gate 110 of FIG. 1. FIG. 10 is described in the context ofFIGS. 1-9 for exemplary purposes only.

Gate driver 1002 may be configured to activate switch 1006. For example,active gate bias driver 1004 may receive a signal (e.g., “LIN”) thatactivates switching element 1022 and deactivates switching element 1024.In some instances, switching element 1022 has a channel resistance of 75to 2 kilo-ohms (kΩ). In the example, diode 1060 bypasses resistiveelement 1062.

Gate driver 1002 may be configured to deactivate switch 1006. Forexample, active gate bias driver 1004 may receive a signal (e.g., “HIN”)that deactivates switching element 1022 and activates switching element1024. In some instances, when switching element 1024 is activated,active gate bias driver 1004 biases gate 1010 according to the followingequation.V _(K)=(R _(ON,N1) +R ₂)/(R _(ON,N1) +R ₂ +R ₁)V _(CC)

In the above equation, R_(ON,N1) is an on resistance of switchingelement 1024, R₁ is a resistance of resistive element 1064, R₂ is aresistance of resistive element 1062. In the above equation R₂ may beselected so that V_(K) is approximately at an optimum gate bias (e.g., 2volts) when switching element 1024 is activated, R₂ is (substantially)greater than R_(P1) (i.e., a resistance of switching element 1022), andR₂ is approximately equal to R_(N1) (i.e., a resistance of switchingelement 1024).

FIG. 11 is a block diagram illustrating a fifth example circuit 1100having active gate bias capability for reducing a reverse recoverycharge in a switch, in accordance with one or more aspects of thepresent disclosure. FIG. 11 shows gate driver 1102, active gate biasdriver 1104, and switch 1106. Gate driver 1102 may be an example of gatedriver 1002 of FIG. 10 and/or gate driver 302 of FIG. 3. For example,switching elements 1122 and 1124 may be examples of switching elements1022 and 1024, respectively, of FIG. 10. Active gate bias driver 1004may be an example of gate bias driver 1004 of FIG. 10. Switch 1106 maybe an example of switch 1006 of FIG. 10. For instance, switch 1106 mayinclude gate 1110, which may be an example of gate 1010 of FIG. 10. FIG.11 is described in the context of FIGS. 1-10 for exemplary purposesonly.

Active gate bias driver 1104 may be similar to active gate bias driver1004 of FIG. 10. For instance, active gate bias driver 1104 may includeresistive element 1164, which may be substantially similar to resistiveelement 1064 of FIG. 10. However, rather than including resistiveelement 1062 in active gate bias driver 1004 as shown in FIG. 10, activegate bias driver 1104 omits a second resistive element, and instead gatedriver 1102 includes resistive element 1162, which may be substantiallysimilar to resistive element 1062.

FIG. 12 is a block diagram illustrating a sixth example circuit 1200having active gate bias capability for reducing a reverse recoverycharge in a switch, in accordance with one or more aspects of thepresent disclosure. FIG. 12 shows gate driver 1202, active gate biasdriver 1204, and switch 1206. Gate driver 1202 may be an example of gatedriver 102 of FIG. 1 and/or an example of gate driver 302 of FIG. 3. Forexample, switching elements 1222 and 1224 may be examples of switchingelements 322 and 324, respectively, of FIG. 3. Active gate bias driver1204 may be an example of active gate bias driver 104 of FIG. 1. Switch1206 may be an example of switch 106 of FIG. 1. For instance, switch1206 may include gate 1210, which may be an example of gate 110 ofFIG. 1. FIG. 12 is described in the context of FIGS. 1-11 for exemplarypurposes only.

Active gate bias driver 1204 may be similar to active gate bias driver1004 of FIG. 10. For instance, active gate bias driver 1204 may includeresistive element 1264, which may be substantially similar to resistiveelement 1064 of FIG. 10. However, rather than including resistiveelement 1062 in active gate bias driver 1004 as shown in FIG. 10, activegate bias driver 1104, instead includes Zener diode 1263.

FIG. 13 is a block diagram illustrating a seventh example circuit 1300having active gate bias capability for reducing a reverse recoverycharge in a switch, in accordance with one or more aspects of thepresent disclosure. FIG. 13 shows gate driver 1302, active gate biasdriver 1304, and switch 1306. Gate driver 1302 may be an example of gatedriver 102 of FIG. 1 and/or an example of gate driver 302 of FIG. 3. Forexample, switching elements 1322 and 1324 may be examples of switchingelements 322 and 324, respectively, of FIG. 3. Active gate bias driver1304 may be an example of active gate bias driver 104 of FIG. 1. Switch1306 may be an example of switch 106 of FIG. 1. For instance, switch1306 may include gate 1310, which may be an example of gate 110 ofFIG. 1. FIG. 13 is described in the context of FIGS. 1-12 for exemplarypurposes only.

Active gate bias driver 1304 may be similar to active gate bias driver1004 of FIG. 10. For instance, active gate bias driver 1304 may includeresistive element 1364, which may be substantially similar to resistiveelement 1064 of FIG. 10. However, rather than including resistiveelement 1062 in active gate bias driver 1004 as shown in FIG. 10, activegate bias driver 1104, instead includes Zener diode 1365.

FIG. 14 is a diagram illustrating a performance of an example systemhaving active gate bias capability for reducing a reverse recoverycharge in a switch, in accordance with one or more aspects of thepresent disclosure. In the example of FIG. 14, an inverter may operateat bus voltage V_(BUS)=300 V, motor phase current I_(motor)=500m_(Arms). As shown, systems using one or more techniques describedherein for reducing a reverse recovery charge in a switch may result incurrent 1402 instead of current 1404. In the example of FIG. 14, adifference of currents 1402 and 1404 results in a 39 percent reductionin a charge level of the switch, thereby reducing a power consumption ofthe switch and a resulting converter compared with systems that omit theone or more techniques described herein for reducing a reverse recoverycharge.

FIG. 15 is a diagram illustrating a switching energy loss (E_(on)), inaccordance with one or more aspects of the present disclosure. In theexample of FIG. 15, a system using one or more techniques describedherein for reducing a reverse recovery charge in a high voltage switchresults in voltage 1504, current 1514, and switching energy loss(E_(on)) 1524. Additionally, as shown, a system omitting the one or moretechniques described herein for reducing the reverse recovery charge inthe high voltage switch results in voltage 1502, current 1512, andswitching energy loss (E_(on)) 1522. In this example, voltages 1502 and1504 are similar but currents 1512 and 1514 are different. Morespecifically, current 1514 is substantially less than current 1512during time span 1530. As such, the system using one or more techniquesdescribed herein for reducing the reverse recovery charge in the highvoltage switch may result in switching energy loss (E_(on)) 1524, whichis about a 19% reduction from switching energy loss (E_(on)) 1522 forthe system omitting the one or more techniques described herein forreducing the reverse recovery charge in the high voltage switch.

FIG. 16 is an exemplary circuit 1600 for a motor application, inaccordance with one or more aspects of the present disclosure. FIG. 16shows gate driver 1602, active gate bias driver 1604, switch 1606, andmotor 1650. Gate driver 1602 may be an example of gate driver 1002 ofFIG. 10 and/or gate driver 302 of FIG. 3. Active gate bias driver 1604may be an example of active gate bias driver 1004 of FIG. 10. Switch1606 may be an example of switch 1006 of FIG. 10. As shown, switch 1606may include M5 1610 and M2 1612. FIG. 16 is described in the context ofFIGS. 1-10 for exemplary purposes only.

In the example of FIG. 16, active gate bias driver 1604 may apply a gatebiasing mechanism to only M5 1610 of six FETs for the motor application.Active gate bias driver 1604 may apply the gate bias after the 0 logicis applied to a channel. Said differently, active gate bias driver 1604may only bias M5 1610, the high side FREDFET on phase V. Active gatebias driver 1604 applies an optimal gate bias when an HIN2 signal is LO,which is when M5 1610 may undergo a commutation and reduce anaccumulation of a minority charge. Active gate bias driver 1604 mayapply the gate bias to affect the complimentary device M2 1612 primarilyto obtain a lower loss in M2 1612 with the gate bias.

FIG. 17 is a diagram illustrating a first thermal performance ofexemplary circuit 1600 of FIG. 16, in accordance with one or moreaspects of the present disclosure. FIG. 17 illustrates temperatures 1702and 1704 for a light load condition of 0.2 Arms. More specifically, FIG.17 illustrates temperature 1702 for M2 1612 as a function of time duringthe light load condition and temperature 1704 for M5 1610 as a functionof time during the light load condition. In the example of FIG. 17,motor 1650 is initially run under reference conditions without applyingactive bias techniques described herein. In this example, whentemperature 1702 of M2 1612 reaches steady state, active gate biasdriver 1604 outputs a gate bias on M5 1610. As shown, temperatures 1702and 1704 are rising with the switches under reference condition. At time1706, M2 1612 reaches steady state and active gate bias driver 1604outputs the gate bias on the high side M5 1610. As shown, temperature1702 at the low side switch (e.g., M2 1612) drops 1.1 degrees Celsius (°C.) after time 1706, which may correspond to a reduction of 9% inswitching energy loss (E_(on)). It should be understood that, in theexample of FIG. 17, active gate bias driver 1604 applies the gate biasto one switch only. However active gate bias driver 1604 may apply theactive bias to all 6 switches, which may result in a bigger drop intemperature (e.g., more than 5 degrees Celsius (° C.) due to mutualheating).

FIG. 18 is a diagram illustrating a second thermal performance ofexemplary circuit 1600 of FIG. 16, in accordance with one or moreaspects of the present disclosure. FIG. 18 illustrates temperatures 1812and 1814 for a full load condition 0.45 Arms. More specifically, FIG. 18illustrates temperature 1812 for M2 1612 as a function of time duringthe heavy load condition and temperature 1814 for M5 1610 as a functionof time during the heavy load condition. In the example of FIG. 18,motor 1650 is initially run under reference conditions without applyingactive bias techniques described herein. In this example, when thetemperature of M2 1612 reaches steady state, active gate bias driver1604 outputs a gate bias on M5 1610. As shown, temperature 1812 at thelow side switch (e.g., M2 1612) drops 1.3 degrees Celsius (° C.) aftertime 1816, which may correspond to a reduction of 7% in switching energyloss (E_(on)). It should be understood that, in the example of FIG. 18,active gate bias driver 1604 applies the gate bias to one switch only.However active gate bias driver 1604 may apply the active bias to all 6switches, which may result in a bigger drop in temperature (e.g., morethan 5 degrees Celsius (° C.) due to mutual heating).

The following “examples” demonstrate some specific aspects of devicesand techniques according to this disclosure.

Example 1

A device comprising: a gate driver configured to output, to a gate of aswitch, a turn-on voltage for activating the switch in response toreceiving an indication to activate the switch; and an active gate biasdriver configured to actively drive a voltage at the gate of the switchto a bias voltage in response to receiving an indication to deactivatethe switch, wherein the bias voltage is less than the turn-on voltageand wherein the bias voltage is greater than a ground voltage of thegate driver.

Example 2

The device of example 1, wherein the active gate bias driver is furtherconfigured to receive a reference voltage signal and wherein the activegate bias driver is further configured to actively drive the voltage atthe gate of the switch to the bias voltage according to the referencevoltage signal.

Example 3

The device of any of examples 1-2 or a combination thereof, wherein thereference voltage signal is generated by a reference voltage sourcehaving a temperature coefficient corresponding to a temperaturecoefficient of the switch.

Example 4

The device of any of examples 1-3 or a combination thereof, wherein theactive gate bias driver is further configured to receive an indicationof a gate voltage at the gate of the switch and wherein the active gatebias driver is further configured to actively drive the voltage at thegate of the switch to the bias voltage according to the indication ofthe gate voltage.

Example 5

The device of any of examples 1-4 or a combination thereof, wherein theactive gate bias driver is further configured to receive an indicationof a current flowing through the switch and wherein the active gate biasdriver is further configured to actively drive the voltage at the gateof the switch to the bias voltage according to the indication of thecurrent flowing through the switch.

Example 6

The device of any of examples 1-5 or a combination thereof, furthercomprising a buffer module configured to: cause the active gate biasdriver to initially output, to the gate of the switch, a bufferedvoltage when actively driving the voltage at the gate of the switch tothe bias voltage; and modify the buffered voltage to correspond to adetected voltage at the gate, the detected voltage being detected afterinitially outputting the buffered voltage and prior to activating theswitch.

Example 7

The device of any of examples 1-6, or a combination thereof, wherein theactive gate bias driver is further configured to actively drive the gateof the switch to the bias voltage during a dead time of the switch,during a body diode conduction of the switch, or a combination thereof.

Example 8

The device of any of examples 1-7 or a combination thereof, wherein thebias voltage is a first bias voltage and wherein the active gate biasdriver is further configured to: actively drive the voltage at the gateof the switch to the first bias voltage during a first dead time of theswitch, the first dead time being before the switch is deactivated; andactively drive the voltage at the gate of the switch to a second biasvoltage during a second dead time of the switch, the second dead timebeing before the switch is activated, wherein the second bias voltage isdifferent from the first bias voltage.

Example 9

The device of any of examples 1-8 or a combination thereof, wherein theactive gate bias driver is a high voltage gate driver and the switch isa high voltage switch.

Example 10

A method comprising: outputting, to a gate of a switch, a turn-onvoltage for activating the switch in response to receiving an indicationto activate the switch; and actively driving a voltage at the gate ofthe switch to a bias voltage in response to receiving an indication todeactivate the switch, wherein the bias voltage is less than the turn-onvoltage and wherein the bias voltage is greater than a ground voltage ofthe switch.

Example 11

The method of example 10, further comprising: receiving a referencevoltage signal; and actively driving the voltage at the gate of theswitch to the bias voltage according to the reference voltage signal.

Example 12

The method of examples 10-11 or a combination thereof, wherein thereference voltage signal is generated by a reference voltage sourcehaving a temperature coefficient corresponding to a temperaturecoefficient of the switch.

Example 13

The method of examples 10-12 or a combination thereof, furthercomprising: receiving an indication of the gate voltage at the gate ofthe switch; and actively driving the voltage at the gate of the switchto the bias voltage according to the indication of the gate voltage.

Example 14

The method of examples 10-13 or a combination thereof, furthercomprising: receiving an indication of a current flowing through theswitch; and actively driving the voltage at the gate of the switch tothe bias voltage according to the indication of the current flowingthrough the switch.

Example 15

The method of examples 10-14 or a combination thereof, furthercomprising: actively driving a voltage at the gate of the switch to thebias voltage by initially outputting, to the gate of the switch, abuffered voltage; modifying the buffered voltage to correspond to adetected voltage at the gate, the detected voltage being detected afterinitially outputting the buffered voltage and prior to activating theswitch.

Example 16

The method of examples 10-15 or a combination thereof, furthercomprising: actively driving the gate of the switch to the bias voltageduring a dead time of the switch, during a body diode conduction of theswitch, or a combination thereof.

Example 17

The method of examples 10-16 or a combination thereof, wherein the biasvoltage is a first bias voltage, the method further comprising: activelydriving the voltage at the gate of the switch to the first bias voltageduring a first dead time of the switch, the first dead time being beforethe switch is deactivated; and actively driving the voltage at the gateof the switch to a second bias voltage during a second dead time of theswitch, the second dead time being before the switch is activated,wherein the second bias voltage is different from the first biasvoltage.

Example 18

A system comprising: a gate driver configured to: generate a firstcontrol signal in response to receiving an indication to activate aswitch, the first control signal being configured to activate a firstswitching element such that the gate drive module outputs, to a gate ofthe switch, a turn-on voltage for activating the switch; and generate asecond control signal in response to receiving an indication todeactivate the switch, the second control signal being configured todeactivate a second switching element such that the gate drive moduleoutputs, to the gate of the switch, a ground voltage for deactivatingthe switch; and an active gate bias driver comprising: a timing controlmodule configured to output an indication to provide an active gate biasvoltage for deactivating the switch based on the first and secondcontrol signals; and an active gate bias module configured to activelydrive a voltage at the gate of the switch to a bias voltage in responseto receiving the indication to provide the active gate bias voltage fordeactivating the switch, wherein the bias voltage is less than theturn-on voltage and wherein the bias voltage is greater than the groundvoltage for deactivating the switch.

Example 19

The system of example 18, further comprising: the switch; and aresistive element configured to output an indication of a currentflowing through the switch, wherein the active gate bias driver isfurther configured to actively drive the voltage at the gate of theswitch to the bias voltage according to the indication of the currentflowing through the switch.

Example 20

The system of examples 18-19 or a combination thereof, furthercomprising a buffer module configured to: cause the active gate biasdriver to initially output, to the gate of the switch, a bufferedvoltage when actively driving the voltage at the gate of the switch tothe bias voltage; and modify the buffered voltage to correspond to adetected voltage at the gate, the detected voltage being detected afterinitially outputting the buffered voltage and prior to activating theswitch.

In one or more examples, the driver functions being performed describedmay be implemented in hardware, software, firmware, or any combinationthereof. If implemented in software, the functions may be stored on ortransmitted over, as one or more instructions or code, acomputer-readable medium and executed by a hardware-based processingunit. Computer-readable media may include computer-readable storagemedia, which corresponds to a tangible medium such as data storagemedia, or communication media including any medium that facilitatestransfer of a computer program from one place to another, e.g.,according to a communication protocol. In this way, computer-readablemedia generally may correspond to (1) tangible computer-readable storagemedia, which is non-transitory or (2) a communication medium such as asignal or carrier wave. Data storage media may be any available mediathat can be accessed by one or more computers or one or more processorsto retrieve instructions, code and/or data structures for implementationof the techniques described in this disclosure. A computer programproduct may include a computer-readable medium.

The techniques of this disclosure may be implemented in a wide varietyof devices or apparatuses, including a wireless handset, an integratedcircuit (IC) or a set of ICs (e.g., a chip set). Various components,modules, or units are described in this disclosure to emphasizefunctional aspects of devices configured to perform the disclosedtechniques, but do not necessarily require realization by differenthardware units. Rather, as described above, various units may becombined in a hardware unit or provided by a collection ofinteroperative hardware units, including one or more processors asdescribed above, in conjunction with suitable software and/or firmware.

Various examples have been described. These and other examples arewithin the scope of the following claims.

What is claimed is:
 1. A device comprising: a gate driver configured toreceive a reference voltage signal and output, to a gate of a switch, aturn-on voltage for activating the switch in response to receiving anindication to activate the switch, wherein the reference voltage signalis generated by a reference voltage source having a temperaturecoefficient corresponding to a temperature coefficient of the switch;and an active gate bias driver configured to actively drive a voltage atthe gate of the switch to a bias voltage according to the referencevoltage signal in response to receiving an indication to deactivate theswitch, wherein the bias voltage is less than the turn-on voltage andwherein the bias voltage is greater than a ground voltage of the gatedriver.
 2. The device of claim 1, wherein the active gate bias driver isfurther configured to receive an indication of a gate voltage at thegate of the switch and wherein the active gate bias driver is furtherconfigured to actively drive the voltage at the gate of the switch tothe bias voltage according to the indication of the gate voltage.
 3. Thedevice of claim 1, wherein the active gate bias driver is furtherconfigured to receive an indication of a current flowing through theswitch and wherein the active gate bias driver is further configured toactively drive the voltage at the gate of the switch to the bias voltageaccording to the indication of the current flowing through the switch.4. The device of claim 1, further comprising a buffer module configuredto: cause the active gate bias driver to initially output, to the gateof the switch, a buffered voltage when actively driving the voltage atthe gate of the switch to the bias voltage; and modify the bufferedvoltage to correspond to a detected voltage at the gate, the detectedvoltage being detected after initially outputting the buffered voltageand prior to activating the switch.
 5. The device of claim 1, whereinthe active gate bias driver is further configured to actively drive thegate of the switch to the bias voltage during a dead time of the switch,during a body diode conduction of the switch, or a combination thereof.6. The device of claim 1, wherein the active gate bias driver is a highvoltage gate driver and the switch is a high voltage switch.
 7. A devicecomprising: a gate driver configured to output, to a gate of a switch, aturn-on voltage for activating the switch in response to receiving anindication to activate the switch; and an active gate bias driverconfigured to actively drive a voltage at the gate of the switch to afirst bias voltage in response to receiving an indication to deactivatethe switch, wherein the first bias voltage is less than the turn-onvoltage and wherein the first bias voltage is greater than a groundvoltage of the gate driver, and wherein the active gate bias driver isfurther configured to: actively drive the voltage at the gate of theswitch to the first bias voltage during a first dead time of the switch,the first dead time being before the switch is deactivated; and activelydrive the voltage at the gate of the switch to a second bias voltageduring a second dead time of the switch, the second dead time beingbefore the switch is activated, wherein the second bias voltage isdifferent from the first bias voltage.
 8. A method comprising: receivinga reference voltage signal; outputting, to a gate of a switch, a turn-onvoltage for activating the switch in response to receiving an indicationto activate the switch, wherein the reference voltage signal isgenerated by a reference voltage source having a temperature coefficientcorresponding to a temperature coefficient of the switch; and activelydriving a voltage at the gate of the switch to a bias voltage accordingto the reference voltage signal in response to receiving an indicationto deactivate the switch, wherein the bias voltage is less than theturn-on voltage and wherein the bias voltage is greater than a groundvoltage of the switch.
 9. The method of claim 8, further comprising:receiving an indication of the gate voltage at the gate of the switch;and actively driving the voltage at the gate of the switch to the biasvoltage according to the indication of the gate voltage.
 10. The methodof claim 8, further comprising: receiving an indication of a currentflowing through the switch; and actively driving the voltage at the gateof the switch to the bias voltage according to the indication of thecurrent flowing through the switch.
 11. The method of claim 8, furthercomprising: actively driving a voltage at the gate of the switch to thebias voltage by initially outputting, to the gate of the switch, abuffered voltage; modifying the buffered voltage to correspond to adetected voltage at the gate, the detected voltage being detected afterinitially outputting the buffered voltage and prior to activating theswitch.
 12. The method of claim 8, further comprising: actively drivingthe gate of the switch to the bias voltage during a dead time of theswitch, during a body diode conduction of the switch, or a combinationthereof.
 13. A method comprising: outputting, to a gate of a switch, aturn-on voltage for activating the switch in response to receiving anindication to activate the switch; and actively driving a voltage at thegate of the switch to a first bias voltage in response to receiving anindication to deactivate the switch, wherein the first bias voltage isless than the turn-on voltage and wherein the first bias voltage isgreater than a ground voltage of the switch, actively driving thevoltage at the gate of the switch to the first bias voltage during afirst dead time of the switch, the first dead time being before theswitch is deactivated; and actively driving the voltage at the gate ofthe switch to a second bias voltage during a second dead time of theswitch, the second dead time being before the switch is activated,wherein the second bias voltage is different from the first biasvoltage.
 14. A system comprising: a gate driver configured to: generatea first control signal in response to receiving an indication toactivate a switch, the first control signal being configured to activatea first switching element such that the gate drive module outputs, to agate of the switch, a turn-on voltage for activating the switch; andgenerate a second control signal in response to receiving an indicationto deactivate the switch, the second control signal being configured todeactivate a second switching element such that the gate drive moduleoutputs, to the gate of the switch, a ground voltage for deactivatingthe switch; and an active gate bias driver comprising: a timing controlmodule configured to output an indication to provide an active gate biasvoltage for deactivating the switch based on the first and secondcontrol signals; and an active gate bias module configured to activelydrive a voltage at the gate of the switch to a bias voltage in responseto receiving the indication to provide the active gate bias voltage fordeactivating the switch, wherein the bias voltage is less than theturn-on voltage and wherein the bias voltage is greater than the groundvoltage for deactivating the switch.
 15. The system of claim 14, furthercomprising: the switch; and a resistive element configured to output anindication of a current flowing through the switch, wherein the activegate bias driver is further configured to actively drive the voltage atthe gate of the switch to the bias voltage according to the indicationof the current flowing through the switch.
 16. The system of claim 14,further comprising a buffer module configured to: cause the active gatebias driver to initially output, to the gate of the switch, a bufferedvoltage when actively driving the voltage at the gate of the switch tothe bias voltage; and modify the buffered voltage to correspond to adetected voltage at the gate, the detected voltage being detected afterinitially outputting the buffered voltage and prior to activating theswitch.